MSE585 F20 Lecture 3 Module 3 - Light Microscopy Instrumentation
MSE 585 F20 Lecture 19 Module 3 - Introduction to TEM
MSE585 F20 Lecture 8 Module 3 - Pure Reflections & Inversions
MSE585 F20 Lecture 18 Module 3 - Electron-Specimen Interactions
MSE 585 F20 Lecture 22 Module 3 - Basics of XPS
MSE585 F20 Lecture 16 Module 3 - Energy-Dispersive Spectroscopy
MSE585 F20 Lecture 3 Module 4 - Kohler Illumination System
MSE585 F20 Lecture 3 Module 1 - Microscope Parameters
MSE585 F20 Lecture 17 Module 3 - Introduction of SEM
MSE585 F20 Lecture 3 Module 2 - Aberrations
MSE 585 F20 Lecture 24 Module 3 - SIMS Instrumentation
MSE585 F20 Lecture 20 Module 3 - Phase-Contrast or HRTEM
MSE585 F20 Lecture 5 Module 3 - Miralax Demonstration
MSE585 F20 Lecture 2 Module 3 - Laser Sieve Demo
MSE585 F20 Lecture 11 Module 3 - Ewald Sphere Worked Problem
MSE585 F20 Lecture 9 Module 3 - Reciprocal Lattices Part 1
MSE585 F20 Lecture 13 Module 3 - XRD Scan Conditions
MSE585 F20 Lecture 7 Module 3 - Designating Planes
MSE 585 F20 Lecture 23 Module 3 - XPS/AES: Local Chemistry
MSE585 F20 Lecture 8 Module 2 - Pure Rotations
MSE 585 F20 Lecture 19 Module 4 - Comparing TEM to Other Microscopes
MSE585 F20 Lecture 18 Module 2 - EM Lenses & Probe Size
MSE 585 F20 Lecture 21 Module 3 - TEM SAD: Diffraction of Polycrystals
MSE585 F20 Lecture 1 Module 2 - Image Formation
MSE585 F20 Lecture 15 Module 3 - Types of Characteristic X-rays
