MSE585 F20 Lecture 19 Module 2 - Specialized SEM
MSE585 F20 Lecture 19 Module 1 - SEM Image Artifacts
MSE 585 F20 Lecture 19 Module 4 - Comparing TEM to Other Microscopes
MSE585 F20 Lecture 1 Module 2 - Image Formation
MSE 585 F20 Lecture 19 Module 3 - Introduction to TEM
MSE585 F20 Lecture 18 Module 3 - Electron-Specimen Interactions
MSE585 F20 Lecture 19 Module 5 - TEM Specimen Prep & Holders
MSE 585 F20 Lecture 18 Module 1 - The Electron Gun
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE585 F20 Lecture 20 Module 1- Contrast in TEM
MSE 585 F20 Lecture 20 Module 2 - Bright- and Dark-Field in TEM
MSE585 F20 Lecture 1 Module 1 - Compound Light Microscope
MSE 585 F20 Lecture 21 Module 5 - Modern Advancements in TEM
MSE585 F20 Lecture 13 Module 2 - Practical Aspects of XRD
MSE 585 F20 Lecture 18 Module 5 - SEM Scanning
MSE585 F20 Lecture 14 Module 1 - XRD Applications
MSE585 F20 Lecture 15 Module 2 - Characteristic X-rays Revisited
FIB lift out
"Transmission electron microscopy" by Eric Stach
MSE585 F20 Lecture 18 Module 6 - SEM Depth of Field
MSE585 F20 Lecture 6 Module 1 - Phase-Contrast Microscopy
MSE585 F20 Lecture 7 Module 3 - Designating Planes
MSE585 F20 Lecture 12 Module 2 - Structure Factor Example 1
MSE585 F20 Lecture 8 Module 5 - Point Groups & Crystal Systems
MSE585 F20 Lecture 14 Module 3 - Example of Indexing Cubic Structures
