MSE585 F20 Lecture 18 Module 3 - Electron-Specimen Interactions
MSE585 F20 Lecture 17 Module 3 - Introduction of SEM
MSE585 F20 Lecture 18 Module 2 - EM Lenses & Probe Size
MSE 585 F20 Lecture 18 Module 1 - The Electron Gun
MSE 585 F20 Lecture 18 Module 5 - SEM Scanning
MSE585 F20 Lecture 18 Module 4 - Backscattered Electrons
MSE585 F20 Lecture 11 Module 3 - Ewald Sphere Worked Problem
MSE585 F20 Lecture 18 Module 6 - SEM Depth of Field
MSE585 F20 Lecture 9 Module 5 - Reciprocal Lattices Part 3
MSE585 F20 Lecture 13 Module 3 - XRD Scan Conditions
MSE585 F20 Lecture 20 Module 1- Contrast in TEM
MSE585 F20 Lecture 9 Module 3 - Reciprocal Lattices Part 1
Diffractive electron mirror in SEM
MSE585 F20 Lecture 14 Module 3 - Example of Indexing Cubic Structures
MSE585 F20 Lecture 3 Module 1 - Microscope Parameters
MSE585 F20 Lecture 1 Module 2 - Image Formation
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE 585 F20 Lecture 21 Module 3 - TEM SAD: Diffraction of Polycrystals
MSE585 F20 Lecture 19 Module 1 - SEM Image Artifacts
MSE 585 F20 Lecture 24 Module 5 - SIMS Spectra
MSE585 F20 Lecture 9 Module 4 - Reciprocal Lattices Part 2
MSE585 F20 Lecture 11 Module 2 - Ewald Sphere Demonstrations
MSE585 F20 Lecture 13 Module 2 - Practical Aspects of XRD
Thermal oxidation of SiC on C-face (left) and Si-face(right) -Molecular Dynamics simulation
MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example
