MSE585 F20 Lecture 17 Module 2 - SEM-EDS Quantitative Analysis
MSE585 F20 Lecture 14 Module 2 - Methodology for Indexing Cubic Structures
MSE585 F20 Lecture 17 Module 1 - Quantitative Analysis for XRF
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE585 F20 Lecture 19 Module 2 - Specialized SEM
MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example
MSE585 F20 Lecture 15 Module 2 - Characteristic X-rays Revisited
Video Abstract: Role of Metal Ion Linked Multilayer Thickness and Substrate Porosity
MSE 585 F20 Lecture 19 Module 4 - Comparing TEM to Other Microscopes
MSE585 F20 Lecture 16 Module 4 - EDS in SEM
Laue diffraction, Laue equation, Ewald’s sphere construction
MSE585 F20 Lecture 16 Module 1 - Wavelength-Dispersive Spectroscopy
Resolução de exercícios - 16/12 - 17h
Lecture 17: Residual Stress in coating
MSE 585 F20 Lecture 19 Module 3 - Introduction to TEM
Instrumentation part 2
Lecture No 17 Electron Interactions
MSE585 F20 Lecture 19 Module 1 - SEM Image Artifacts
Introduction to X ray Spectroscopies and Fundamentalsof X ray Absorption Fine Structure 2.
mod10lec47
Symmetry Part 1 - Rotations, Mirror plane, and Inversion center
10/17/16 Intro to MSE dislocations, defects, and microscopy
Diffraction Lecture 14: Scattering in Two and Three Dimensions
Introduction to X ray Spectroscopies and Fundamentalsof X ray Absorption Fine Structure 1.
MSE585 F20 Lecture 14 Module 3 - Example of Indexing Cubic Structures
