MSE585 F20 Lecture 16 Module 5 - SEM-EDS Scanning Modes
MSE585 F20 Lecture 16 Module 4 - EDS in SEM
MSE 585 F20 Lecture 18 Module 5 - SEM Scanning
MSE585 F20 Lecture 8 Module 5 - Point Groups & Crystal Systems
MSE 585 F20 Lecture 24 Module 5 - SIMS Spectra
MSE585 F20 Lecture 18 Module 6 - SEM Depth of Field
MSE 585 F20 Lecture 24 Module 4 - SIMS: Types of Mass Analyzers
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
"Transmission electron microscopy" by Eric Stach
MSE585 F20 Lecture 10 Module 1 - Generation of X-rays
MSE 585 F20 Lecture 22 Module 5 - Instrumentation of XPS/AES
Crystal structure 4 lattice directions planes and reciprocal lattice
How to line scan
MSE585 F20 Lecture 14 Module 3 - Example of Indexing Cubic Structures
Menno Fraters: Computing Crystal/Lattice preferred orientation in ASPECT
MSE585 F20 Lecture 19 Module 1 - SEM Image Artifacts
Lec 13: Real and reciprocal lattices
MSE585 F20 Lecture 13 Module 2 - Practical Aspects of XRD
mod10lec47
Precipitate analysis in AA6xxx Friction stir processed samples using SEM, EDS mapping
