MSE585 F20 Lecture 14 Module 5 - Predicting Intensities of a Single Phase
MSE585 F20 Lecture 14 Module 2 - Methodology for Indexing Cubic Structures
MSE585 F20 Lecture 8 Module 5 - Point Groups & Crystal Systems
MSE585 F20 Lecture 14 Module 4 - Quantitative Analysis of Mixed-Phase Samples
MSE585 F20 Lecture 13 Module 5 - XRD Distortions: Residual Stress
MSE585 F20 Lecture 14 Module 3 - Example of Indexing Cubic Structures
MSE585 F20 Lecture 8 Module 2 - Pure Rotations
MSE585 F20 Lecture 10 Module 1 - Generation of X-rays
MSE585 F20 Lecture 9 Module 4 - Reciprocal Lattices Part 2
MSE 585 F20 Lecture 23 Module 5 - XPS/AES: Compositional Mapping
MSE585 F20 Lecture 19 Module 5 - TEM Specimen Prep & Holders
MSE585 F20 Lecture 13 Module 4 - XRD Distortions: Peak Broadening
MSE585 F20 Lecture 9 Module 3 - Reciprocal Lattices Part 1
MSE585 F20 Lecture 6 Module 2 - Polarized Light Microscopy
Diffraction Lecture 14: Scattering in Two and Three Dimensions
Multiplicity
M-14. Atomic & Geometrical Factors
MSE585 F20 Lecture 3 Module 2 - Aberrations
MSE 201 S21 Lecture 14 - Module 4 - Defects in Ceramics Example
MSE585 F20 Lecture 1 Module 1 - Compound Light Microscope