MSE 585 F20 Lecture 22 Module 2 - Basics of Photoelectrons
MSE 585 F20 Lecture 22 Module 3 - Basics of XPS
MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example
MSE 585 F20 Lecture 22 Module 1 - Introduction to Surface Characterization
MSE 585 F20 Lecture 22 Module 4 - Basics of AES
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE 585 F20 Lecture 20 Module 2 - Bright- and Dark-Field in TEM
MSE 585 F20 Lecture 23 Module 2 - XPS Spectra
MSE 585 F20 Lecture 23 Module 1 - XPS/AES Spectra Identification
MSE 585 F20 Lecture 22 Module 5 - Instrumentation of XPS/AES
MSE 585 F20 Lecture 24 Module 1 - Basics of SIMS
MSE 585 F20 Lecture 22 Module 6 - XPS/AES: Depth Profiling
MSE 585 F20 Lecture 23 Module 5 - XPS/AES: Compositional Mapping
MSE 585 F20 Lecture 21 Module 4 - Imaging Defects in TEM
MSE 585 F20 Lecture 23 Module 4 - XPS/AES: Surface Charging
MSE 585 F20 Lecture 24 Module 5 - SIMS Spectra
FEI Tecnai F20 S/TEM: using Low-Mag (LM) mode
22 - Amplitude contrast
MSE585 F20 Lecture 20 Module 1- Contrast in TEM
18.2 - Diffraction pattern indexing and stereographic projection
