MSE 585 F20 Lecture 22 Module 1 - Introduction to Surface Characterization
MSE 585 F20 Lecture 22 Module 2 - Basics of Photoelectrons
MSE 585 F20 Lecture 22 Module 3 - Basics of XPS
MSE 585 F20 Lecture 22 Module 4 - Basics of AES
MSE 585 F20 Lecture 23 Module 1 - XPS/AES Spectra Identification
MSE 585 F20 Lecture 24 Module 1 - Basics of SIMS
MSE 585 F20 Lecture 22 Module 5 - Instrumentation of XPS/AES
MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example
MSE 585 F20 Lecture 22 Module 6 - XPS/AES: Depth Profiling
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE 585 F20 Lecture 23 Module 5 - XPS/AES: Compositional Mapping
MSE 585 F20 Lecture 23 Module 4 - XPS/AES: Surface Charging
MSE585 F20 Lecture 20 Module 1- Contrast in TEM
MSE 585 F20 Lecture 23 Module 2 - XPS Spectra
MSE 585 F20 Lecture 20 Module 2 - Bright- and Dark-Field in TEM
MSE 585 F20 Lecture 24 Module 5 - SIMS Spectra
MSE 585 F20 Lecture 21 Module 4 - Imaging Defects in TEM
MSE585 F20 Lecture 1 Module 1 - Compound Light Microscope
22 - Amplitude contrast
M-22. ESCA - Instrumentation
MSE585 F20 Lecture 6 Module 1 - Phase-Contrast Microscopy
Tutorial 4 - Correlation of Diffraction Spots to Microstructure
Monocular Depth Prediction Through Continuous 3D Loss
18.2 - Diffraction pattern indexing and stereographic projection
MSE585 F20 Lecture 10 Module 1 - Generation of X-rays
