MSE 585 F20 Lecture 21 Module 4 - Imaging Defects in TEM
MSE 585 F20 Lecture 21 Module 5 - Modern Advancements in TEM
MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example
MSE 585 F20 Lecture 19 Module 4 - Comparing TEM to Other Microscopes
MSE 585 F20 Lecture 21 Module 3 - TEM SAD: Diffraction of Polycrystals
MSE 585 F20 Lecture 24 Module 4 - SIMS: Types of Mass Analyzers
MSE 585 F20 Lecture 21 Module 1 - TEM SAD: Indexing Cubic Patterns
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE 585 F20 Lecture 20 Module 2 - Bright- and Dark-Field in TEM
MSE585 F20 Lecture 20 Module 4 - TEM Selected-Area Diffraction
Lec 21 - Contrast from Strain Fields
MSE585 F20 Lecture 7 Module 4 - Example Problems of Points, Directions and Planes
MSE 585 F20 Lecture 24 Module 5 - SIMS Spectra
MSE 585 F20 Lecture 15 - Module 1 - Introduction to X-ray Spectroscopy
MSE 403 S21 Lecture 4 - Module 1 - Factors Influencing Ceramic Structures
MSE585 F20 Lecture 20 Module 1- Contrast in TEM
MSE 585 F20 Lecture 22 Module 3 - Basics of XPS
MSE 585 F20 Lecture 19 Module 3 - Introduction to TEM
MSE 403G S21 Lecture 3 - Module 4 - Band Theory
Chapter 4 Defects in Crystalline Materials Line Defects
