MSE 585 F20 Lecture 19 Module 4 - Comparing TEM to Other Microscopes
MSE 585 F20 Lecture 19 Module 3 - Introduction to TEM
MSE585 F20 Lecture 20 Module 4 - TEM Selected-Area Diffraction
MSE 585 F20 Lecture 20 Module 2 - Bright- and Dark-Field in TEM
MSE 585 F20 Lecture 21 Module 5 - Modern Advancements in TEM
MSE 585 F20 Lecture 23 Module 3 - XPS/AES: Local Chemistry
MSE585 F20 Lecture 19 Module 5 - TEM Specimen Prep & Holders
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example
MSE 585 F20 Lecture 23 Module 5 - XPS/AES: Compositional Mapping
MSE 585 F20 Lecture 18 Module 5 - SEM Scanning
Dislocation interaction with grain boundaries
MSE 585 F20 Lecture 21 Module 1 - TEM SAD: Indexing Cubic Patterns
MSE585 F20 Lecture 7 Module 4 - Example Problems of Points, Directions and Planes
MSE 585 F20 Lecture 18 Module 1 - The Electron Gun
"Transmission electron microscopy" by Eric Stach
MSE585 F20 Lecture 11 Module 4 - Diffraction Intensity
temDM 17–non-linear STEM correction
MSE585 F20 Lecture 1 Module 1 - Compound Light Microscope
MSE585 F20 Lecture 18 Module 6 - SEM Depth of Field