MSE 585 F20 Lecture 18 Module 5 - SEM Scanning
MSE 585 F20 Lecture 24 Module 5 - SIMS Spectra
MSE585 F20 Lecture 18 Module 2 - EM Lenses & Probe Size
MSE 585 F20 Lecture 18 Module 1 - The Electron Gun
MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions
MSE 585 F20 Lecture 23 Module 5 - XPS/AES: Compositional Mapping
MSE585 F20 Lecture 18 Module 6 - SEM Depth of Field
Refractive Index and Sample Preparation
MSE 585 F20 Lecture 21 Module 3 - TEM SAD: Diffraction of Polycrystals
Lab Module 5 Thermal Analysis of Phase Diagrams
MSE585 F20 Lecture 19 Module 5 - TEM Specimen Prep & Holders
MSE585 F20 Lecture 20 Module 1- Contrast in TEM
MSE585 F20 Lecture 18 Module 4 - Backscattered Electrons
Lec 5: Componants of SEM|Electron sources, objective, condenser lenses and specimen chambers
Electron matter interaction
Integrated Nanoscale Field Emission Devices
Thermal oxidation of SiC on C-face (left) and Si-face(right) -Molecular Dynamics simulation
Yoh Matsuki- Surface-only spectroscopy- DNP MAS NMR at 30 K and 16.4 T using closed-cycle helium MAS
Reciprocal lattice to BCC lattice and Ewald Construction
X-Ray Diffraction (XRD) Reflection Conditions (or Extinction Rules)
